| Hitachi X-MET8000 Optimum Handheld XRF Analyzer for Metal Sorting | alloygeek.com | 38494.5 USD | 48,400 USD | −20.5% |
| Hitachi X-MET8000 Optimum Handheld XRF Analyzer for Consumer Goods | alloygeek.com | 40694.5 USD | 51,150 USD | −20.4% |
| Hitachi X-MET8000 Optimum Geo Handheld XRF Analyzer for Archaeometry | alloygeek.com | 41794.5 USD | 52,030 USD | −19.7% |
| Hitachi X-MET8000 Optimum Geo Handheld XRF Analyzer for Mining and Mineral Exploration | alloygeek.com | 41794.5 USD | 52,030 USD | −19.7% |
| Hitachi X-MET8000 Optimum Geo Handheld XRF Analyzer for Environmental Soil Screening | alloygeek.com | 41794.5 USD | 52,030 USD | −19.7% |
| Hitachi X-MET8000 Expert Geo Handheld XRF Analyzer for Soil Contamination Testing | alloygeek.com | 54994.5 USD | 65,998.9 USD | −16.7% |
| Hitachi X-MET8000 Smart Handheld XRF Analyzer for Alloy Sorting & Metal Identification | alloygeek.com | 24189 USD | — | — |
| FlexSEM1000 II | spectral.se | 1 SEK | — | — |
| HF5000 | spectral.se | 1 SEK | — | — |
| HT7800 120kV TEM | spectral.se | 1 SEK | — | — |
| IL1000 | spectral.se | 1 SEK | — | — |
| IM4000 PLUS Ion Milling | spectral.se | 1 SEK | — | — |
| IM4000PLUS Ion Milling with cryo cooling | spectral.se | 1 SEK | — | — |
| ArBlade5000 Ion Milling System | spectral.se | 1 SEK | — | — |
| ArBlade5000 Ion Milling System with Cryo Cooling | spectral.se | 1 SEK | — | — |
| MC1000 Sputter Coater | spectral.se | 1 SEK | — | — |
| NX2000 FIB-SEM for Wafers | spectral.se | 1 SEK | — | — |
| Ethos NX5000 FIB-SEM | spectral.se | 1 SEK | — | — |
| NX9000 FIB-SEM for Real-time 3D Analysis | spectral.se | 1 SEK | — | — |
| S-3000N Tungsten filament VP-SEM | spectral.se | 1 SEK | — | — |
| Hitachi S-4800 Ultra High Resolution Cold FE-SEM | spectral.se | 1 SEK | — | — |
| SU3800 SEM | spectral.se | 1 SEK | — | — |
| SU3800SE FE-SEM | spectral.se | 1 SEK | — | — |
| SU3900 SEM | spectral.se | 1 SEK | — | — |
| SU3900SE FE-SEM | spectral.se | 1 SEK | — | — |
| SU7000 FE-SEM | spectral.se | 1 SEK | — | — |
| SU8600 FE-SEM | spectral.se | 1 SEK | — | — |
| SU8700 FE-SEM | spectral.se | 1 SEK | — | — |
| Hitachi SU8700 Ultrahigh-Resolution Analytical Schottky FESEM | spectral.se | 1 SEK | — | — |
| SU9600 FE-SEM | spectral.se | 1 SEK | — | — |
| UVD - CL Detector | spectral.se | 1 SEK | — | — |
| Wafer Surface Inspection System LS Series | spectral.se | 1 SEK | — | — |
| ZoneSEM II | spectral.se | 1 SEK | — | — |
| ZoneTEM | spectral.se | 1 SEK | — | — |
| CG7300 CD-SEM | spectral.se | 1 SEK | — | — |
| CS5000 CD-SEM | spectral.se | 1 SEK | — | — |
| CT1000 Defect Review SEM | spectral.se | 1 SEK | — | — |
| DI2800 | spectral.se | 1 SEK | — | — |
| DI4600 Dark Field Wafer Defect Inspection System | spectral.se | 1 SEK | — | — |
| X-ray Particle Contaminant Analyzer EA8000A | spectral.se | 1 SEK | — | — |